| 2024 |
Amit Kumar, Shashank Banchhor, Pradyum Pal, Narendra Pratap, Shubham Chaurasia, Ashutosh Yadav, Sudeb Dasgupta, Anand Bulusu and Nitanshu Chauhan |
Self Heating Induced Reliability Issues and Revealing Early Ageing in Thin PDSOI Transistor |
EDTM Bangalore |
Scopus |
| 2023 |
N.Chauhan, A. Behera, C. Garg, S. Dasgupta, A. Bulusu |
“Impact of Non-Uniform Ferroelectric Dielectric Phase and Metal Grains on the Performance of MFM Capacitor and Ferroelectric FETs |
ISAF USA |
Scopus |
| 2023 |
S. Banchhor, N. Bagga, N. Chauhan, S. Manikandan, A. Dasgupta, S. Dasgupta, A. Bulusu |
“A New Insight into the Saturation Phenomenon in Nanosheet Transistor: A Device Optimization Perspective |
EDTM Seoul Korea |
Scopus |
| 2022 |
S. Manikandan, N. Chauhan, N. Bagga, S. Banchhor, A. Kumar, A. Dasgupta, S. Roy, A. Bulusu, S. Dasgupta |
Analysis and Modeling of Leakage Currents in Stacked Gate-All-Around Nanosheet Transistors |
ICEE IISC Bangalore |
Scopus |
| 2022 |
N. Chauhan, S. Dasgupta, A. Bulusu |
Impact of Polarization Switching on Hysteresis-Free and Hysteresis Based Ferroelectric FET |
VDAT IIT Jammu |
Scopus |
| 2021 |
Gupta, N. Chauhan, O. Prakash and H. Amrouch |
Variability Effects in FinFET Transistors and Emerging NC-FinFET |
International Conference on IC Design and Technology (ICICDT) |
Scopus |
| 2021 |
Gupta, N. Chauhan, O. Prakash and H. Amrouch |
On the Resiliency of NC-FinFET SRAMs against Variation: MFIS Structure |
International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) |
Scopus |
| 2019 |
N. Chauhan, G. Bajpai, S. Banchhor, N. Bagga |
Analysis of Transient Negative Capacitance Characteristics for Stabilization and Amplification |
VDAT |
Scopus |
| 2020 |
G. Bajpai, A. Gupta, N. Chauhan |
Automated Designing of Single Stage Operational Amplifier and Its Teleportation Among Different Technology Nodes |
ICEEE |
Scopus |
| 2019 |
N. Bagga, N. Chauhan, A. Bulusu, and S. Dasgupta |
Demonstration of a Novel Ferroelectric-Dielectric Negative Capacitance Tunnel FET |
MOS-AK India |
Scopus |
| 2021 |
S. Yadav, N. Chauhan, A. Pandey, R. Pratap, and A. Bulusu |
Behaviour of FinFET Inverter’s Effective Capacitances in LowVoltage Domain |
VDAT |
Scopus |
| 2020 |
S. Banchhor, N. Chauhan, A. Doneria and B. Anand |
Gain Stabilization Methodology for FinFET Amplifiers Considering SelfHeating Effect |
VLSI Design Conference |
Scopus |
| 2021 |
V. Kumar, N. Chauhan, S. Dasgupta |
Optimization of Negative Differential Conductance Point for Multi Gate Devices Considering Self Heating Effects Using Surface To Volume Approach |
IWPSD |
Scopus |
| 2021 |
S. Banchhor, N. Bagga, N. Chauhan, S. Roy, A. Dasgupta, A. Bulusu, S. Dasgupta |
Analysis of Self-Heating in 5nm Stacked Nanosheet Transistor |
IWPSD |
SCOPUS |
| 2022 |
N. Bagga, Kai Ni, N. Chauhan, O. Prakash, X. Sharon, H. Amrouch |
Cleaved-Gate Ferroelectric FET for Reliable Multi-Level Cell Storage |
International Reliability Physics Symposium |
scopus |
| 2021 |
Aniket Gupta, Govind Bajpai, Priyanshi Singhal, Navjeet Bagga, Om Prakash, Shashank Banchhor, Hussam Amrouch, N. Chauhan |
Traps Based Reliability Barrier on Performance and Revealing Early Ageing in Negative Capacitance FET |
International Reliability Physics Symposium 2021 |
SCOPUS |
| 2022 |
N. Chauhan, C. Garg, Kai Ni, A. K. Behera, S. Yadav, S. Banchhor, N. Bagga, A. Dasgupta, A. Datta, S. Dasgupta, A. Bulusu |
Impact of Random Spatial Fluctuation in Non-Uniform Crystalline Phases on Multidomain MFIM Capacitor and Negative Capacitance FDSOI |
International Reliability Physics Symposium 2022 |
SCOPUS |
| 2019 |
N. Chauhan, N. Bagga, S. Banchhor, A. Bulusu and S. Dasgupta |
Transient Behavior Negative capacitance with stabilization and Amplification: A Simulation Approach |
IWPSD |
Scopus |
