National Institute of Technology Uttarakhand

Year	Author(s)	Title	Journal Name	Indexing	Quality	Impact Factor
2021	Sarita Yadav, Nitanshu Chauhan, Shobhit Tyagi, Arvind Sharma, Shashank Banchhor, Rajiv Joshi, Rajendra Pratap and Anand Bulusu	A physical insight into variation aware minimum VDD for deep subthreshold operation of FinFET	Semiconductor Science and Technology, IOP	SCI
2022	Sarita Yadav, Nitanshu Chauhan, Raghav Chawla, Arvind Sharma, Shashank Banchhor, Rajendra Pratap and Bulusu Anand	Through-silicon-via induced stress-aware FinFET buffer sizing in 3D ICs Volume 37	Semiconductor Science and Technology	SCI