| 2024 |
D K Sharma, Gourab Das, A K Singh, Aalim Ansari and Vivek Kumar |
Random Telegraphic Noise in Metal Induced crystallized silicide deposited for different deposition rates in ebeam deposition |
National Conference on Emerging Micro/Nano-Electronics: Devices, Technology & VLSI Design,Kurukshetra University, Kurukshetra, Haryana, India |
Scopus |
| 2025 |
Harsh Kumar, Vivek Kumar |
Parameterized Thermal Compact Modeling for Effective Thermal Management of Advanced Common Multigate Transistors in Sub-7 nm Technology Nodes |
24th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems, Dallas, Texas, USA |
Scopus |
| 2025 |
Banit Negi, Hariharan Muthusamy and Vivek Kumar |
2D Thermal Contour Modeling of 14 nm SOI FinFET using Machine Learning for Efficient Thermal Profile Prediction |
38th IEEE International Conference on VLSI Design, The Leela Palace, Bengaluru, India |
Scopus |
| 2024 |
Shivang Bhargav, Vibhu, Vivek Kumar and Sparsh Mittal |
Machine Learning Based Algorithm for Shockley-Read-Hall Recombination and Augur Recombination Predictions |
10th IEEE International Symposium on Smart Electronic Systems (IEEE – iSES), Delhi |
Scopus |
| 2024 |
Jyoti Patel, Nitya Aggarwal, Navjeet Bagga*, Vivek Kumar, Ankit Dixit, Naveen Kumar, Vihar Georgiev, Sudeb Dasgupta |
Demonstration and Optimization of Multi-Fin Dual Spacer FinFET for Reliable sub-THz Frequency Operation |
2024 IEEE 24th International Conference on Nanotechnology (NANO). July 8-11, 2024, Gijón, Spain |
Scopus |
| 2024 |
J. Patel, Vivek Kumar, N. Bagga, S. Dasgupta |
Small Signal Analysis of Nanosheet Transistor for sub-THz Frequency Considering Intersheet Capacitances and Modified Admittance Parameters |
82nd Device Research Conference The University of Maryland, College Park |
Scopus |
| 2024 |
Jyoti Patel, Ankit Dixit, Naveen Kumar, Navjeet Bagga, Bathula Satwik, Ishani Bais, Chirag Arora, Vivek Kumar,Vihar Georgiev, S Dasgupta |
Machine Learning Augmented TCAD Assessment of Corner Radii in Nanosheet FET |
10th Joint EuroSOI Workshop and International Conference on Ultimate Integration on Silicon (EuroSOI-ULIS 2024), 15-17 May 2024, Glyfada, Attica, Greece |
Scopus |
| 2024 |
J. Patel, S. Rai, Vivek Kumar, and S. Dasgupta |
Interface Trap Analysis in Multi-Fin FinFET Technology: a Crucial Reliability Issue in Digital Application |
IEEE International Symposium on Circuits & Systems, to be held in Singapore |
Scopus |
| 2024 |
Deepak Kumar Sharma, Arjun Datta, Jatinder Pal Singh, Kanishk K, Rohan Srivastava, Gourab Das, Jyoti Kedia, Sanjeev Kumar, Vivek Kumar and Arun Kumar Singh |
Understanding Trap-Induced Barrier Height Fluctuations in Nickel-Silicon Contacts for Advanced Semiconductor Technology |
8th IEEE Electron Devices Technology and Manufacturing (IEEE EDTM) , Hotel Hiton Bengaluru (Accepted) |
Scopus |
| 2024 |
Vivek Kumar, Nischal Anand, Rohit Rai, Sneha Chauhan and Jyoti Patel |
Unveiling Thermal Cross Talk in 5nm Gate-All-Around Stacked Nanosheet FETs: A Machine Learning Perspective |
37th International Conference on VLSI Design, ITC Kolkata |
Scopus |
| 2023 |
Aditya Kumar Singh, Vivek Kumar, Jyoti Patel and Sudeb Dasgupta |
Analysis and Modeling of Self Heating and Substrate Induced Transitions in 5 nm Stacked Nanosheet FET |
27th International Symposium on VLSI Design and Test (VDAT-2023), BITs Pilani |
Scopus |
| 2023 |
Jyoti Patel, Govind Sharma, Chitraja Rajan, Vivek Kumar and Sudeb Dasgupta |
Power Efficient Hardware Fingerprint: Exploiting Process-Variations in A Quasi-Planar 14nm FinFET |
19th IEEE APCCAS 2023, Hyderabad |
Scopus |
| 2023 |
Nischal Anand, Rohit Rai, Yashvi Verma, Amit Singh Chauhan, Deepak Kumar Sharma, Vivek Kumar |
TCAD-Based Analysis of Nanosheet and Forksheet FET Electrical Characteristics in the Presence of Gamma and Heavy Ion Radiation |
11th International Conference on ESDC, Jointly Organized by IIIT Sri City and London Digital Twin Research Centre (UK) |
Scopus |
| 2023 |
Vivek Kumar, Arnab Datta and Sudeb Dasgupta |
Ab initio Multiscale Thermal Modeling of 5 nm Stacked Nanosheet Field Effect Transistor for thermal hotspot Optimization inside the channel (Accepted) |
22nd ITherm-2023 at Orlando, FL, USA |
Scopus |
| 2023 |
Vivek Kumar, Jyoti Patel, Arnab Datta and Sudeb Dasgupta |
FEM modeling of gate resistance for 5 nm SGC/DGC Stacked Nanosheet Transistor (Accepted) |
36th International Conference on VLSI Design, Hyderabad |
Scopus |
| 2023 |
Vibhu V, Sparsh Mittal and Vivek Kumar |
A Machine Learning-based model for Single Event Upset Current Prediction in 14nm FinFETs (Accepted) |
36th International Conference on VLSI Design, Hyderabad |
Scopus |
| 2022 |
Vivek Kumar, J. Patel, A. Datta, and S. Dasgupta |
FEM Modeling of Thermal Aspect of Dielectric Inserted Under Source & Drain of 5nm Nanosheet |
26th International Symposium on VLSI Design and Test (VDAT-2022), Indian Institute of Technology, Jammu (IIT Jammu),2022 |
Scopus |
| 2022 |
P. Bharti, H. Muthusamy, and Vivek Kumar |
Thermal Resistance Extraction of 14 nm SOI FinFET:A Machine Learning Based Approach |
2nd IEEE International Conference on Emerging Frontiers in Electrical and Electronic Technologies, NIT Patna |
Scopus |
| 2021 |
Vivek Kumar, N. Chauhan, A. Datta, and S. Dasgupta |
Optimization of Negative Differential Conductance (NDC) Point for Multi Gate Devices Considering Self Heating Effects using Surface to Volume Ratio (SVR) |
21st International Workshop on Physics of Semiconductor Devices (IWPSD), IIT - Delhi & SSPL - Delhi |
Scopus |
